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24 December 2002 Applications of x-ray intensity interferometry
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Abstract
Intensity interferometry was applied for characterizing hard synchrotron radiation. Propagation of transverse coherence was evaluated by a couple of coincidence measurements, which have different source-to-image distances. Influences of phase object under several conditions were measured and discussed. X-ray pulse width was determined with high accuracy by scanning bandwidth of monochromator. Application to the next generation synchrotron sources was discussed.
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Makina Yabashi, Kenji Tamasaku, and Tetsuya Ishikawa "Applications of x-ray intensity interferometry", Proc. SPIE 4782, X-Ray Mirrors, Crystals, and Multilayers II, (24 December 2002); https://doi.org/10.1117/12.450979
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