21 November 2002 Development of a two-dimensional focusing faceted x-ray analyzer
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Abstract
We present a new concept for an X-ray analyzer for meV-spectroscopy with hard X-rays in the range of 20 keV. The analyzer consists of a 5"-diameter planar glass disk with about 8000 silicon crystal pixels glued to it. With a spherical bender it is bent to a radius of 6 m. The slope error over a 4"-diameter area is about 0.8 μm RMS. Used in a spectrometer for inelastic X-ray scattering as an analyzer, an overall energy resolution of 1.0 meV at 25.7 keV and of 1.8 meV at 21.6 keV is obtained.
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Harald Sinn, Nicolai A. Moldovan, Ayman H. Said, Ercan E. Alp, "Development of a two-dimensional focusing faceted x-ray analyzer", Proc. SPIE 4783, Design and Microfabrication of Novel X-Ray Optics, (21 November 2002); doi: 10.1117/12.451185; https://doi.org/10.1117/12.451185
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