21 November 2002 Development of a two-dimensional focusing faceted x-ray analyzer
Author Affiliations +
Abstract
We present a new concept for an X-ray analyzer for meV-spectroscopy with hard X-rays in the range of 20 keV. The analyzer consists of a 5"-diameter planar glass disk with about 8000 silicon crystal pixels glued to it. With a spherical bender it is bent to a radius of 6 m. The slope error over a 4"-diameter area is about 0.8 μm RMS. Used in a spectrometer for inelastic X-ray scattering as an analyzer, an overall energy resolution of 1.0 meV at 25.7 keV and of 1.8 meV at 21.6 keV is obtained.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Harald Sinn, Harald Sinn, Nicolai A. Moldovan, Nicolai A. Moldovan, Ayman H. Said, Ayman H. Said, Ercan E. Alp, Ercan E. Alp, } "Development of a two-dimensional focusing faceted x-ray analyzer", Proc. SPIE 4783, Design and Microfabrication of Novel X-Ray Optics, (21 November 2002); doi: 10.1117/12.451185; https://doi.org/10.1117/12.451185
PROCEEDINGS
8 PAGES


SHARE
Back to Top