Paper
10 January 2003 Excimer laser processing for the integrated gamma-ray detectors
Atsushi Nakamura, Madan Niraula, Koji Asano, Toru Aoki, Yoshinori Hatanaka
Author Affiliations +
Abstract
Selective operation of laser doping process and laser ablation process using KrF excimer laser irradiation (wavelength 248nm, pulse duration 20ns) was carried out that is used for fabricating an integrated gamma-ray imaging detector. At high vacuumed condition, laser irradiated surface region is heated up to ablated. At high-pressure condition, ablation is suppressed and impurity on the surface was melt and diffuse into the CdTe substrate. We have fabricated an integrated imaging detector using above combination process. The detector showed low leakage current at room temperature and good gamma-ray detection property.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Atsushi Nakamura, Madan Niraula, Koji Asano, Toru Aoki, and Yoshinori Hatanaka "Excimer laser processing for the integrated gamma-ray detectors", Proc. SPIE 4784, X-Ray and Gamma-Ray Detectors and Applications IV, (10 January 2003); https://doi.org/10.1117/12.455779
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Cited by 2 scholarly publications.
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KEYWORDS
Sensors

Excimer lasers

Indium

Crystals

Doping

Gamma radiation

Diffusion

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