The main goal of this paper is the optimization of X-View, a turn-key detection system for high resolution and real-time X-ray non-destructive testing. X-View consists of an microfocus X-ray generator and an acquisition detection system. Two large area detection systems have been developed based on amorphous (a-Si:H) and new CMOS technologies.
The first one consists of an X-ray scintillator converter, arrays of amorphous silicon thin film transistors (TFT) and photodiodes (pitch down to 100 μm). The second one, based on CMOS technology, used in high resolution applications, consists of a scintillator and arrays of CMOS photodiodes (pitch of 50 μm). Both are equipped with a fast real-time electronic system for readout and digitization of images and appropriate computer tools for control, real-time image treatment data representation and off-line analysis.
Images quality have been improved using a microfocus X-ray generator (focus of 50 μm). Decreasing the spot size of the generator improves the X-ray image quality. The geometric blurring is reduced, and object magnifications are possible.
Our study presents the main characteristics of both detection systems (wide dynamic range, lack of blooming, high frame rate), quantitative and qualitative analysis X-ray inspection applications (electronics, various industries, medical, pharmaceutical, etc).