Paper
18 November 2002 Silicon-based glancing incidence reflection superposition lens
Alexandru Dan Stoica, Xun Li Wang
Author Affiliations +
Abstract
Many topics of interest for neutron scattering demand small sampling volumes. Then the scattering instruments should include focusing devices in order to deliver a sharp spatially shaped neutron beam at the sample position. Moreover the wavelength bandwidth should be sufficiently large if time-of-flight method is used. In this contribution a new compact focusing device is proposed. The device is made of a stack of bent silicon wafers, each having a glancing reflective layer deposited on one side and a neutron absorbing layer on the other side. This device acts as a lens by superposing the images delivered by individual mirrors. The aberrations are minimized due to the short length of the device. From this point of view this type of superposition lens is equivalent to a long elliptic or parabolic mirror. Consequently a two dimensional focusing could be obtained by combining two devices in a Kirkpatrik-Baez set-up. Basic design principles are described and Monte-Carlo simulation results are presented. Possible applications in neutron instrumentation are reviewed.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexandru Dan Stoica and Xun Li Wang "Silicon-based glancing incidence reflection superposition lens", Proc. SPIE 4785, Advances in Neutron Scattering Instrumentation, (18 November 2002); https://doi.org/10.1117/12.451685
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

Semiconducting wafers

Silicon

Reflectors

Scattering

Superposition

Reflectivity

RELATED CONTENT

Neutron imaging with Bragg mirrors
Proceedings of SPIE (November 08 2001)
Neutron reflectometry and high-resolution imaging
Proceedings of SPIE (November 23 1992)
Polarizing supermirror devices: some new developments
Proceedings of SPIE (November 23 1992)
A Polarization Diversity Surface Analysis System
Proceedings of SPIE (September 01 1987)

Back to Top