18 November 2002 Silicon-based glancing incidence reflection superposition lens
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Abstract
Many topics of interest for neutron scattering demand small sampling volumes. Then the scattering instruments should include focusing devices in order to deliver a sharp spatially shaped neutron beam at the sample position. Moreover the wavelength bandwidth should be sufficiently large if time-of-flight method is used. In this contribution a new compact focusing device is proposed. The device is made of a stack of bent silicon wafers, each having a glancing reflective layer deposited on one side and a neutron absorbing layer on the other side. This device acts as a lens by superposing the images delivered by individual mirrors. The aberrations are minimized due to the short length of the device. From this point of view this type of superposition lens is equivalent to a long elliptic or parabolic mirror. Consequently a two dimensional focusing could be obtained by combining two devices in a Kirkpatrik-Baez set-up. Basic design principles are described and Monte-Carlo simulation results are presented. Possible applications in neutron instrumentation are reviewed.
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Alexandru Dan Stoica, Alexandru Dan Stoica, Xun Li Wang, Xun Li Wang, } "Silicon-based glancing incidence reflection superposition lens", Proc. SPIE 4785, Advances in Neutron Scattering Instrumentation, (18 November 2002); doi: 10.1117/12.451685; https://doi.org/10.1117/12.451685
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