X-ray spectroscopy and calibrations in the 50- to 60-keV range

John F. Seely; Lawrence T. Hudson; James L. Weaver; Glenn E. Holland; Craig Nelson Boyer

doi:10.1117/12.451750

26 November 2002 X-ray spectroscopy and calibrations in the 50- to 60-keV range

John F. Seely, Lawrence T. Hudson, James L. Weaver, Glenn E. Holland, Craig Nelson Boyer

Proceedings Volume 4786, Penetrating Radiation Systems and Applications IV; (2002) https://doi.org/10.1117/12.451750
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

Spectrometers have been developed to record x-ray spectra in the energy range 50 eV to 60 keV. The dispersion elements are transmission crystals for energies higher than approximately 10 keV, reflection crystals for 1 keV to 20 keV, and transmission gratings for energies less than 1 keV. The two-dimensional spectral images are recorded on a CCD or CMOS sensor with a phosphor conversion screen. Silicon photodiodes are positioned in front of the 2D sensor to provide absolute x-ray flux calibrations. The diodes have 1 mm² area and sub-nanosecond time response. The diodes, transmission gratings, and attenuation filters were absolutely calibrated using synchrotron radiation. In addition, the diodes were calibrated in pulsed mode using the soft x-ray (70 eV to 250 eV) pulses from individual electron bunches circulating in the synchrotron storage ring, and a self-calibration model extends the calibration to higher energy. X-ray and extreme ultraviolet spectra were recorded at the OMEGA and NIKE laser facilities. A hard x-ray spectrometer is being built for the National Ignition Facility (NIF) that covers the 1 keV to 20 keV range with one transmission crystal channel and four reflection crystal channels.

Citation Download Citation

John F. Seely, Lawrence T. Hudson, James L. Weaver, Glenn E. Holland, and Craig Nelson Boyer "X-ray spectroscopy and calibrations in the 50- to 60-keV range", Proc. SPIE 4786, Penetrating Radiation Systems and Applications IV, (26 November 2002); https://doi.org/10.1117/12.451750

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