Optical and electronic characterization on HgCdTe materials

Junhao Chu; Young Chang; Zhiming Huang; Yongsheng Gui; X. G. Wang; X. F. Lu; Li He; Dingyuan Tang

doi:10.1117/12.452272

5 December 2002 Optical and electronic characterization on HgCdTe materials

Junhao Chu, Young Chang, Zhiming Huang, Yongsheng Gui, X. G. Wang, X. F. Lu, Li He, Dingyuan Tang

Proceedings Volume 4795, Materials for Infrared Detectors II; (2002) https://doi.org/10.1117/12.452272
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

Some new results about the optical and electronic characterization on HgCdTe materials have been reported in this paper. The photoluminescence measurements for HgCdTe sample have been performed to characterize the impurities states in HgCdTe and the quality of the crystal perfection. The optical constants in the energy region below, near and above the energy gap for Hg_1-xCd_xTe materials have been investigated by infrared spectroscopic ellipsometry measurements using a monochromatic dispersion infrared ellipsometer in the wavelength region of 2 to 12.5μm. Variable magnetic field Hall measurements (0-10T) were performed on MBE-grown Hg_1-xCd_xTe films and on boron ion implanted bulk n-type Hg_1-xCd_xTe at various temperatures (1.2 ~300K). By a hybrid approach consisting of mobility spectrum (MS) analysis followed by a multi-carrier fitting (MCF) procedure, the contributions to the total conductivity arising from all kinds of carriers in the sample including in the bulk and on the surface layer have been separated. The Cd composition distribution image for HgCdTe sample has been realized by using a thermal image system from measuring the transmittance distribution and calculating the composition distribution.

Citation Download Citation

Junhao Chu, Young Chang, Zhiming Huang, Yongsheng Gui, X. G. Wang, X. F. Lu, Li He, and Dingyuan Tang "Optical and electronic characterization on HgCdTe materials", Proc. SPIE 4795, Materials for Infrared Detectors II, (5 December 2002); https://doi.org/10.1117/12.452272

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