26 February 2003 Morphology of MDMO-PPV:PCBM bulk heterojunction organic solar cells studied by AFM, KFM, and TEM
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Abstract
The microstructure of MDMO-PPV:PCBM blends as used in bulk hetero-junction organic solar cells was studied by Atomic Force Microscopy (AFM) and Kelvin Force Microscopy (KFM) to image the surface morphology and by means of Transmission Electron Microscopy (TEM) to reveal images of the film's interior. By introducing KFM, it was possible to demonstrate that phase separated domains have different local electrical properties than the surrounding matrix. Since blend morphology clearly influences global electrical properties and photovoltaic performance, an attempt to control the morphology by means of casting conditions was undertaken. By using AFM, it has been proven that not only the choice of solvent, but also drying conditions dramatically influence the blend structure. Therefore, the possibility of discovering the blend morphology by AFM, KFM and TEM makes them powerful tools for understanding today's organic photovoltaic performances and for screening new sets of materials.
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Tom Martens, Tom Martens, Zjef Beelen, Zjef Beelen, Jan D'Haen, Jan D'Haen, Tom Munters, Tom Munters, Ludwig Goris, Ludwig Goris, Jean Manca, Jean Manca, Marc D'Olieslaeger, Marc D'Olieslaeger, Dirk Vanderzande, Dirk Vanderzande, Luc De Schepper, Luc De Schepper, Ronn Andriessen, Ronn Andriessen, } "Morphology of MDMO-PPV:PCBM bulk heterojunction organic solar cells studied by AFM, KFM, and TEM", Proc. SPIE 4801, Organic Photovoltaics III, (26 February 2003); doi: 10.1117/12.452453; https://doi.org/10.1117/12.452453
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