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23 October 2002 Spectral hole-burning of rare-earth ions doped in AL2O3-SiO2 glass
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Abstract
Al2O3-SiO2 glasses doped with Sm3+ ions were prepared using sol-gel method, in which the Sm3+ ions were reduced into Sm2+ by heaing in H2-gas or irradiating with x-ray. When heated in H2 gas, the H2 molecules react with oxygen ions to form H2O. Removal of the generated H2O causes the number of oxygen ions surrounding Sm3+ to decrease, resulting into the resuction of the Sm3+ ions. in contrast, in the x-ray irradiated glass, it is concluded that the Sm3+ ions are reduced into Sm2+ by electron transfer from the oxygen defect center. The hole defect centers are trapped in oxygen ions boound with Al3+ ions. The spectral hole burning of the x-ray irradiated glasses could be burned by the reverse reaction of the reduction of Sm3+ ions, that is, the electron transfer from the excited Sm2+ into the surrounding oxygen. A short distance between the Sm2+ and oxygen defect centers brings fast hole burning. On the other hand, the hole burning in the H2-treated glasses was performed by the electron transfer between the Sm2+ and the trapping center such as Sm3+.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masayuki Nogami and Kazuhiro Suzuki "Spectral hole-burning of rare-earth ions doped in AL2O3-SiO2 glass", Proc. SPIE 4804, Sol-Gel Optics VI, (23 October 2002); https://doi.org/10.1117/12.458829
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