5 November 2002 Si nanostructures embedded in SiO2: electronic and optical properties
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Abstract
We present ab initio results for the structural, electronic and optical properties of silicon nanostructures confined by silicon dioxide. We investigate the role of the dimension, symmetry and bonding situations at the interfaces. In particular we consider Si/SiO2 superlattices and Si nanocrystals embedded in SiO2 matrix. In the case of Si/SiO2 superlattices the presence of oxygen defects at the interface and the dimensionality are the key points in order to explain the experimental outcomes concerning photoluminescence. For Si nanocrystals embedded in SiO2 we show, in agreement with experimental results, the close interplay between chemical and structural effects on the electronic and optical properties.
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Stefano Ossicini, Elena Degoli, Marcello Luppi, Rita Magri, "Si nanostructures embedded in SiO2: electronic and optical properties", Proc. SPIE 4808, Optical Properties of Nanocrystals, (5 November 2002); doi: 10.1117/12.452043; https://doi.org/10.1117/12.452043
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