25 September 2002 Measurement of small birefringence in sapphire and quartz plates
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Abstract
Birefringence in quartz and sapphire plates was measured at 632.8 nm. The observed birefringence is presumed to be caused by a tilt in the optic axis with respect to the plate geometry. Two instrumental methods were used to make the measurements. A Mueller matrix laser polarimeter was used at the Air Force Research Laboratory, and the Exicor system was used at Hinds. The measurement techniques are described and results are presented.
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Dennis H. Goldstein, Lynn L. Deibler, Baoliang Bob Wang, "Measurement of small birefringence in sapphire and quartz plates", Proc. SPIE 4819, Polarization Measurement, Analysis, and Applications V, (25 September 2002); doi: 10.1117/12.454834; https://doi.org/10.1117/12.454834
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