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25 September 2002 Measurement of small birefringence in sapphire and quartz plates
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Birefringence in quartz and sapphire plates was measured at 632.8 nm. The observed birefringence is presumed to be caused by a tilt in the optic axis with respect to the plate geometry. Two instrumental methods were used to make the measurements. A Mueller matrix laser polarimeter was used at the Air Force Research Laboratory, and the Exicor system was used at Hinds. The measurement techniques are described and results are presented.
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Dennis H. Goldstein, Lynn L. Deibler, and Baoliang Bob Wang "Measurement of small birefringence in sapphire and quartz plates", Proc. SPIE 4819, Polarization Measurement, Analysis, and Applications V, (25 September 2002);

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