Paper
23 January 2003 Progress of ICC α-cell microbolometer development program
Kevin Charles Liddiard, Jonathan P. Knauth, Ryan Decker, Bruce Altermus, Bai Xu, Nigel Robinson
Author Affiliations +
Abstract
In a previous paper to the present forum we outlined the Infrared Components Corporation (ICC) microbolometer development program based on technology licensed from the Australian Defence Science and Technology Organisation (DSTO). We presented an overview of the processing technology and discussed the technology transfer package being developed for implementation in a silicon MEMS foundry. In this paper the progress of the program will be reported, including work at DSTO and Electro-optic Sensor Design (EOSD), and technology transfer to the 200mm MEMS foundry at the SUNY Albany Institute of Materials (UAIM). The development of a new readout integrated circuit (ROIC) and associated camera initiatives at ICC will be discussed.
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Kevin Charles Liddiard, Jonathan P. Knauth, Ryan Decker, Bruce Altermus, Bai Xu, and Nigel Robinson "Progress of ICC α-cell microbolometer development program", Proc. SPIE 4820, Infrared Technology and Applications XXVIII, (23 January 2003); https://doi.org/10.1117/12.451217
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KEYWORDS
Sensors

Resistance

Amorphous silicon

Microbolometers

Semiconducting wafers

Cameras

Silicon

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