25 November 2002 Measurement of the o-ray and e-ray infrared refractive index and absorption coefficients of sapphire from 10K to 295K
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Abstract
We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm-1 to 10000 cm-1 wavenumber range and temperatures from 10 K to 295 K. The refractive index is determined by a combination of room-temperature minimum-deviation prism measurements at 2950 cm-1 and temperature-dependent high-resolution transmission measurements of a 1 mm thick etalon sample from the same batch of material. A Brewster-angle polarizer with an extinction ratio of <10-5 is used for polarization selection. The uncertainties in the fringe-counting method are analyzed. The temperature dependence of the absorption coefficient is compared with the predictions of a multi-phonon model for sapphire.
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Simon G. Kaplan, Michael E. Thomas, "Measurement of the o-ray and e-ray infrared refractive index and absorption coefficients of sapphire from 10K to 295K", Proc. SPIE 4822, Cryogenic Optical Systems and Instruments IX, (25 November 2002); doi: 10.1117/12.451770; https://doi.org/10.1117/12.451770
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KEYWORDS
Sapphire

Absorption

Refraction

Fabry–Perot interferometers

Transmittance

Temperature metrology

Prisms

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