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8 August 2003 Linearity characterization of NIST's infrared spectral regular transmittance and reflectance scales
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Proceedings Volume 4826, Fourth Oxford Conference on Spectroscopy; (2003) https://doi.org/10.1117/12.514482
Event: Fourth Oxford Conference on Spectroscopy, 2002, Davidson, NC, United States
Abstract
In the past decade, scales for infrared spectral regular (specular) transmittance and reflectance have been established at the National Institute of Standards and Technology (NIST). Recently, we have developed an error budget based on direct evaluation of the sources of error in the measurement process. These include the detection system non-linearity, spatial non-uniformity of the detector, misalignment of components, inter-reflection between components, asymmetry of sample and reference measurements, and source polarization effects. Here we describe the evaluation of the linearity of our measurement system that includes a Fourier transform spectrophotometer, integrating sphere and MCT detector. From the linearity results, relative responsivity curves are also established.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Leonard M. Hanssen and Simon G. Kaplan "Linearity characterization of NIST's infrared spectral regular transmittance and reflectance scales", Proc. SPIE 4826, Fourth Oxford Conference on Spectroscopy, (8 August 2003); https://doi.org/10.1117/12.514482
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