NPL correction kit for enhanced and traceable reflectance measurement

Peter J. Clarke

doi:10.1117/12.514533

8 August 2003 NPL correction kit for enhanced and traceable reflectance measurement

Peter J. Clarke

Proceedings Volume 4826, Fourth Oxford Conference on Spectroscopy; (2003) https://doi.org/10.1117/12.514533
Event: Fourth Oxford Conference on Spectroscopy, 2002, Davidson, NC, United States

Abstract

A prototype kit containing artefacts, best practice guide and software for enhancing reflectance measurement data are described. The kit uses measurements made on calibrated artefacts to make other reflectance measurement data more reliable, in terms of zero offset and linearity, while also providing traceability to national reflectance scales. The use of the kit can give agreement between measurements made on the same artefact by different instruments of less than the colour discrimination limit of the human eye of 0.5 ΔE*_ab colour difference units.

Citation Download Citation

Peter J. Clarke "NPL correction kit for enhanced and traceable reflectance measurement", Proc. SPIE 4826, Fourth Oxford Conference on Spectroscopy, (8 August 2003); https://doi.org/10.1117/12.514533

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