22 May 2002 Vibration analysis of layered structures by optoelectronics methods
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Proceedings Volume 4827, Fifth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications; (2002) https://doi.org/10.1117/12.468151
Event: Fifth International Conference on Vibration Measurements by Laser Techniques, 2002, Ancona, Italy
Abstract
Today, the vibration analysis of laminated structures represents an important field in engineering metrology. To perform non-invasive vibration measurements in industrial environments, optical methods are a preferable choice. Electronic Speckle Pattern Interferometry is a method, which permits full field and non-contacting displacement or deformation measurements. The experimental measurement of the resonant frequencies for the piezoceramic material is generally performed by impedance analysis. In this work, Electronic Speckle Pattern Interferometry (ESPI) technique is proposed for studying vibration of piezoceramic/nickel circular laminated plates. The circular membrane is a composite made of a nickel alloy disk with thickness 0. 1 mm and diameter 32 mm, to which a piezoceramic disk, with the same thickness and a smaller diameter (24 mm) is bonded. The time average frame subtraction technique is improved by subtracting two Bessel fringe patterns at two different amplitude levels. A brief analysis of the techniques and some preliminary experimental tests are presented.
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Giuseppe Schirripa Spagnolo, Giuseppe Schirripa Spagnolo, Massimo Pappalardo, Massimo Pappalardo, Antonio Iula, Antonio Iula, Riccardo Carotenuto, Riccardo Carotenuto, Raffaele Majo, Raffaele Majo, Dario Ambrosini, Dario Ambrosini, Domenica Paoletti, Domenica Paoletti, } "Vibration analysis of layered structures by optoelectronics methods", Proc. SPIE 4827, Fifth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (22 May 2002); doi: 10.1117/12.468151; https://doi.org/10.1117/12.468151
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