19 November 2003 Confocal microscopy for the testing of integrated optical devices
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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.527040
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
Planar waveguides have been realized in lithium fluoride crystals by ion-beam irradiation. Ion bombardment produces color centers in the LiF crystal, increasing locally the refractive index. Confocal microscopy is applied to the characterization of the waveguides in order to assess the uniformity and distribution of color centers through the measurement of the photoluminescence emission.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Franco Quercioli, Franco Quercioli, Bruno Tiribilli, Bruno Tiribilli, Massimo Vassalli, Massimo Vassalli, A. Ghirelli, A. Ghirelli, Giancarlo C. Righini, Giancarlo C. Righini, Stefano Pelli, Stefano Pelli, Marco Cremona, Marco Cremona, } "Confocal microscopy for the testing of integrated optical devices", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.527040; https://doi.org/10.1117/12.527040
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