19 November 2003 Direct near-surface measurement of refractive index: extension of the Brewster-Pfund method to graded-index films
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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.524576
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
As a complement to the standard m-line method, where an analytical curve is fitted to the measurements of waveguide modes and extrapolated to provide the refractive index in the zero-depth limit, we review our polarimetric approach to a direct-near surface measurement of graded-index films, and present its new and more straightforward version, which is applicable to existing samples without masking procedures prior to ion exchange.
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Marcelo Barbalho Pereira, Marcelo Barbalho Pereira, Flavio Horowitz, Flavio Horowitz, } "Direct near-surface measurement of refractive index: extension of the Brewster-Pfund method to graded-index films", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.524576; https://doi.org/10.1117/12.524576
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