19 November 2003 Hidden grids, moire patterns, and 3D metrology
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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.524147
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
Operations with optoelectronic hidden grid moire patterns to measure the distance from the camera to the object being observed were described in a recent paper. Now, in this paper, the possibility to make 3D metrological teleoperations based on hidden grids moire patterns is discussed.
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Pablo F. Meilan, Pablo F. Meilan, Anibal P. Laquidara, Anibal P. Laquidara, Mario Garavaglia, Mario Garavaglia, } "Hidden grids, moire patterns, and 3D metrology", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.524147; https://doi.org/10.1117/12.524147
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