19 November 2003 Imaging with a scatter-probe near filed optical microscope
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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.529214
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
Using a scanning near-field optical microscope with a metallic probe tip (Fig 1), we investigate the formation of near-field optical images. The scatter-probe is used only for converting an evanescent field to a propagating field and the detection system is in the far-field. This situation models the usual experimental set up employed in scatter-probe near-field microscopy. The calculations of the scattered intensity at constant height were based on an integral equation, method of moments approach.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor Ruiz-Cortes, Victor Ruiz-Cortes, Saul Alonso Zavala Ortiz, Saul Alonso Zavala Ortiz, Pedro Negrete-Regagnon, Pedro Negrete-Regagnon, Eugenio R. Mendez, Eugenio R. Mendez, Hector Manuel Escamilla, Hector Manuel Escamilla, } "Imaging with a scatter-probe near filed optical microscope", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.529214; https://doi.org/10.1117/12.529214
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