Paper
19 November 2003 Pulsed laser deposition of Cd1-xMnxTe thin films
A. P. Caricato, Emilia D'Anna, M. Fernandez, Gilberto Leggieri, Armando Luches, E. Mero, Maurizio Martino
Author Affiliations +
Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.530040
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
Cd1-xMnxTe thin films (0.6 - 0.7 μm) were deposited by laser ablation of targets with x = 0.05, 0.36, 0.43 and 0.50. Ablation was performed with a XeCl laser at a fluence of 6 J/cm2. Films were deposited on sapphire substrates placed at 40 mm from the target and heated at 250°C. Their composition results in good agreement with the one of the relative targets, except for a systematic defiance in the Cd content. The surface morphology deteriorates as Mn concentration increases. From optical transmission measurements in the 200 - 3500 nm range the band-gap energies were calculated. From photoluminescence spectroscopy only the peak at 2.0 eV, associated to the Mn2+ 6A1(6S) → 4T2(4G) transition, was detected in samples with x &tpprime;≥ 0.36.
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A. P. Caricato, Emilia D'Anna, M. Fernandez, Gilberto Leggieri, Armando Luches, E. Mero, and Maurizio Martino "Pulsed laser deposition of Cd1-xMnxTe thin films", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.530040
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KEYWORDS
Manganese

Spectroscopy

Thin films

Cadmium

Laser ablation

Luminescence

Pulsed laser deposition

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