19 November 2003 RE-ion and TM-ion doped silicate glasses for planar waveguide lasers & amplifiers
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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.524946
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
The paper compares the spectroscopic properties of RE-doped and transition-ion doped modified silicate glasses for their applications in broadband amplifiers and tunable lasers. The effect of structural modification with fluorine in Er-doped modified silicate is discussed by the reference of reduced Er-Er ion cross relaxation in the host. The measured lifetimes for the 4I13/24I15/2 transition at 1 mole percent in modified silicate glass samples having fluoride to oxide ratio (F/O) of 0.25 vary between 11 and 12 ms. The measured lifetime at room temperature is for 3T23A2 in Cr4+-doped silicate was 250 μs derived from a double exponential. The mechanisms for the prolonged lifetime of upper levels in both Er- and Cr-doped glasses are discussed.
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Shaoxiong Shen, Shaoxiong Shen, Caroline Anne Batchelor, Caroline Anne Batchelor, Animesh Jha, Animesh Jha, } "RE-ion and TM-ion doped silicate glasses for planar waveguide lasers & amplifiers", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.524946; https://doi.org/10.1117/12.524946
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