19 November 2003 Refractive index inhomogeneity measurement of a parallel plate in a Fizeau interferometer by a new wavelength scanning algorithm
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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.530070
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
Interferometric measurement of the refractive index inhomogeneity of a glass parallel plate has been demonstrated experimentally to a resolution of 10-6. Wavelength scanning interferometry allows the simultaneous measurement of optical thickness and surface shape of a parallel optical plate. A new sampling function suppresses the first-order refractive index dispersion and multiple-beam interference noise to give a measurement resolution of 2 nm in optical thickness.
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Kenichi Hibino, Kenichi Hibino, Bozenko F. Oreb, Bozenko F. Oreb, Philip S. Fairman, Philip S. Fairman, } "Refractive index inhomogeneity measurement of a parallel plate in a Fizeau interferometer by a new wavelength scanning algorithm", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.530070; https://doi.org/10.1117/12.530070
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