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19 November 2003 Scanning total internal reflection fluorescence microscopy
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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.529180
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
We report on a new form of total internal reflection fluorescence microscopy. Instead of using a prism, an objective of numerical aperture 1.65 is used under ring beam illumination. As a result, the propagating component of the illumination wave is suppressed and a focused evanescent spot is produced with strength of 20 times stronger than that in the prism. A near-field image is obtained by the scanning of a sample illuminated by the evanescent focal spot. The new imaging system has been successfully used for characterizing CdSe quantum dot nanoparticles and will be useful in nano-fabrication and single-molecular detection.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Min Gu and James Won Min Chon "Scanning total internal reflection fluorescence microscopy", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.529180
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