Paper
19 November 2003 Simultaneous measurements of thermal optical and linear thermal expansion coefficients of Ta2O5 films
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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.530051
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
An experimental determination technique for simultaneous measurements of the thermal optical and the linear thermal expansion coefficients of tantalum pentoxide thin films at infrared wavelength region is described. A tantalum pentoxide thin film deposited directly onto the end face of a single mode optical fiber was illuminated with a SLD source and its spectrum on reflection was monitored at various temperatures using an optical spectrum analyzer. Temperature induced change in the index of refraction and the film thickness were determined from the spectrum to calculate the thermal optical and the linear thermal expansion coefficients simultaneously.
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Mehmet Naci Inci "Simultaneous measurements of thermal optical and linear thermal expansion coefficients of Ta2O5 films", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.530051
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Cited by 5 scholarly publications.
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KEYWORDS
Thermography

Tantalum

Thin films

Temperature metrology

Reflection

Refractive index

Optical coatings

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