19 November 2003 Variable resolution profilometer for artwork surface topography
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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.524910
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
We propose an optical method to evaluate deterioration mechanisms affecting cultural heritage materials. The method is based on a phase element, which forms interference fringes on the object. The surface topography is obtained by a phase shifting technique.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giuseppe Schirripa Spagnolo, Giuseppe Schirripa Spagnolo, Raffaele Majo, Raffaele Majo, Dario Ambrosini, Dario Ambrosini, Domenica Paoletti, Domenica Paoletti, } "Variable resolution profilometer for artwork surface topography", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.524910; https://doi.org/10.1117/12.524910
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