19 November 2003 Wide field, phase measuring confocal microscopy of small particles
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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.529191
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
Amplitude and phase measurements of small particles using a wide field, phase measuring confocal microscope are demonstrated. The wide field confocal capability of the microscope is achieved by illuminating both sample and reference arms of a Linnik interferometer with a moving speckle pattern. In addition a rigorous vector diffraction microscope model based upon Mie scattering theory has been developed. The model is particularly useful as by careful consideration of the scattered and unscattered light, quantitative transmission images can be achieved.
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N. B. E. Sawyer, Stephen P. Morgan, Michael G. Somekh, Chung Wah See, B. Y. Shekunov, E. Astrakharchik, "Wide field, phase measuring confocal microscopy of small particles", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.529191; https://doi.org/10.1117/12.529191
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