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23 December 2002 Novel method for precise focal length measurement
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Proceedings Volume 4832, International Optical Design Conference 2002; (2002) https://doi.org/10.1117/12.486480
Event: International Optical Design Conference 2002, 2002, Tucson, AZ, United States
Abstract
A new technique for precise focal length measurements by use of a hologram is presented. The hologram is used in first order diffraction to emulate the reflective properties of a convex spherical mirror when performing null tests with a phase-shifting interferometer. The hologram, comprised of concentric reflective rings (much like a Fresnel zone plate), is written lithographically and offers a higher degree of precision, at lower cost, than its spherical mirror counterpart and many other potential measurement techniques.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian J. DeBoo and Jose M. Sasian "Novel method for precise focal length measurement", Proc. SPIE 4832, International Optical Design Conference 2002, (23 December 2002); https://doi.org/10.1117/12.486480
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