17 February 2003 High resolution index of refraction profiling of optical waveguides
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Proceedings Volume 4833, Applications of Photonic Technology 5; (2003) https://doi.org/10.1117/12.473921
Event: Applications of Photonic Technology 5, 2002, Quebec City, Canada
Abstract
A comparison is made between three high spatial resolution index of refraction profiling techniques:reflection-NSOM, microreflection and AFM plus selective chemical etching using the very small elliptical core of a polarization maintaining E-fiber from Andrew Corporation as a test waveguide.
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Roderick S. Taylor, Roderick S. Taylor, Cyril Hnatovsky, Cyril Hnatovsky, } "High resolution index of refraction profiling of optical waveguides", Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); doi: 10.1117/12.473921; https://doi.org/10.1117/12.473921
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