17 February 2003 Spatially resolved measurement of slow-axis pseudo near-field of diode laser arrays
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Proceedings Volume 4833, Applications of Photonic Technology 5; (2003); doi: 10.1117/12.474836
Event: Applications of Photonic Technology 5, 2002, Quebec City, Canada
Abstract
Pseudo near-field intensity distributions of 1-cm diode-laser bars in slow-axis plane were recorded without parasitic feedback by automated scanning with a slanted highly-reflecting thin metal wire. Irregularities in field patterns are correlated with local curvature and twisting of facets. Information on mode guiding within the semiconductor laser can be derived.
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G. Seewald, Ruediger Grunwald, "Spatially resolved measurement of slow-axis pseudo near-field of diode laser arrays", Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); doi: 10.1117/12.474836; https://doi.org/10.1117/12.474836
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KEYWORDS
Semiconductor lasers

Near field

Diodes

Spatial resolution

Signal detection

Metals

Polarization

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