7 February 2003 Performance and results of the NAOS visible wavefront sensor
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Abstract
The NAOS adaptive optics system was installed in December 2001 on the Nasmyth focus of the ESO VLT. It includes two wavefront sensors: one is working at IR wavelength analysis and the other at visible wavelengths. This paper describes the NAOS Visible Wave Front Sensor based on a Shack-Hartman principle and its performances as measured on the sky. This wavefront sensor includes within a continuous flow liquid nitrogen cryostat: 1) a low noise fast readout CCD camera controlled by the ESO new generation CCD system FIERA using a fast frame rate EEV/Marconi CCD-50 focal plane array. This 128×128 pixels focal plane array has a readout noise of 3 e- at 50 kilopixel/sec/port. FIERA provides remotely controlled readout modes with optional binning, windowing and flexible integration time. 2) two remotely exchangeable micro-lens arrays (14×14 and 7×7 micro-lenses) cooled at the CCD temperature ( -100 °C) within the cryostat. The CCD array is directly located in the micro lenses focal plane at a few millimeters apart without relay optics. 3) Additional opto-mechanical functions are also provided (atmospheric dispersion compensator, flux level control, field of view limitation). On sky performances of the wavefront sensor are presented. Adaptive Optics corrections was obtained with a reference star as faint as a visible magnitude 17 with a band-path of 40 Hz in close loop.
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Philippe Feautrier, Philippe Feautrier, Gerard Rousset, Gerard Rousset, Reinhold J. Dorn, Reinhold J. Dorn, Cyril Cavadore, Cyril Cavadore, Julien Charton, Julien Charton, Claudio Cumani, Claudio Cumani, Thierry Fusco, Thierry Fusco, Norbert N. Hubin, Norbert N. Hubin, Pierre Y. Kern, Pierre Y. Kern, Jean-Luis Lizon, Jean-Luis Lizon, Yves Magnard, Yves Magnard, Pascal Puget, Pascal Puget, Didier Rabaud, Didier Rabaud, Patrick Rabou, Patrick Rabou, Eric Stadler, Eric Stadler, } "Performance and results of the NAOS visible wavefront sensor", Proc. SPIE 4839, Adaptive Optical System Technologies II, (7 February 2003); doi: 10.1117/12.458945; https://doi.org/10.1117/12.458945
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