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11 March 2003 Sub-arcsecond, differential deflectometry to measure thermally induced distortions of the Swift optical bench
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Abstract
The Swift optical bench is a roughly 2.7 m diameter, 0.1 m thick composite structure carrying the Burst Alert Telescope (BAT), X-ray Telescope (XRT), and the Ultraviolet Optical Telescope (UVOT) as well as various attitude control instrumentation for the spacecraft. A high precision test of the optical bench using multi-aperture optical deflectometry was developed to verify that the relative boresights of the XRT and UVOT instruments would not change by more than several arcseconds when a worst case on-orbit temperature gradient is imposed through the thickness of the bench. Results of validation tests in a laminar flow cleanroom environment without vibration isolation demonstrated a differential measurement capability with 0.2 arcsecond sensitivity and 0.5 arcsecond accuracy per day. The technique is easily adaptable to similar deflection monitoring requirements for other large spacecraft structures.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Douglas B. Leviton, Brad J. Frey, Larry E. Madison, James A. Parker, and Oren E. Sheinman "Sub-arcsecond, differential deflectometry to measure thermally induced distortions of the Swift optical bench", Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, (11 March 2003); https://doi.org/10.1117/12.474308
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