Paper
26 February 2003 Dependence of the micro-arcsecond metrology (MAM) testbed performance prediction on white light algorithm approach
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Abstract
MAM is a dedicated systems-level testbed that combines the major SIM subsystems including laser metrogy, pointing, and pathlength control. The testbed is configured as a modified Michelson interferometer for the purpose of studying the white-light fringe measurement processes. This paper will compare the performance of various algorithms using the MAM data, and will aid in our recommendation of how the SIM flight system should process the science and guide interferometer data.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
TsePyng Janice Shen, Joseph Catanzarite, Mark H. Milman, and Gregory W. Neat "Dependence of the micro-arcsecond metrology (MAM) testbed performance prediction on white light algorithm approach", Proc. SPIE 4852, Interferometry in Space, (26 February 2003); https://doi.org/10.1117/12.460921
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Charge-coupled devices

Stars

Metrology

Calibration

Optical testing

Diagnostics

Algorithm development

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