26 February 2003 Diffraction hardware testbed and model validation
Author Affiliations +
Proceedings Volume 4852, Interferometry in Space; (2003); doi: 10.1117/12.460697
Event: Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States
Optical systems, which operate over a wide range of Fresnel numbers, are often times performance-limited by diffraction effects. In order to characterize such effects at the 40-100 picometer level, a diffraction testbed has been built which has the capability of measuring diffraction effects at this level. Concurrently, mathematical diffraction modeling tools have been developed that propagate an input wavefront through an optical train, while retaining amplitude and phase information at a grid resolution sufficient for yielding picometer-resolution diffraction test data. This paper contains a description of this diffraction hardware testbed, the diffraction modeling approach, and a comparison of the modeled and hardware test results, which then serves as validation of the diffraction modeling methodology.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David B. Schaechter, Patrick E. Perkins, Paul V. Mammini, David A. Swanson, Chris W. Tischhauser, Robert S. Benson, Torben B. Andersen, Richard S. Bruner, Richard I. Fowler, Kevin T. Morimoto, Lisa A. Sievers, "Diffraction hardware testbed and model validation", Proc. SPIE 4852, Interferometry in Space, (26 February 2003); doi: 10.1117/12.460697; https://doi.org/10.1117/12.460697


Data modeling

Phase measurement

Hardware testing


Beam splitters



Ultrahigh resolution interferometry
Proceedings of SPIE (July 19 1996)
Laser metrology in the micro-arcsecond metrology testbed
Proceedings of SPIE (February 14 2005)
Optical design of the SIM system testbed III
Proceedings of SPIE (July 05 2000)
Wavefront sensor with an unharmonic grating
Proceedings of SPIE (March 01 1996)

Back to Top