SIM external metrology beam launcher (QP) development

Lawrence L. Ames; Robert Barrett; Raymond M. Bell Jr.; Lawrence J. Dries; Kalyan Dutta; Peter G. Halverson; Buck Holmes; Eric T. Kvamme; David F. Leary; Patrick Perkins; Mark Scott; Timothy E. Van Eck; Feng Zhao

doi:10.1117/12.460946

26 February 2003 SIM external metrology beam launcher (QP) development

Lawrence L. Ames, Robert Barrett, Raymond M. Bell Jr., Lawrence J. Dries, Kalyan Dutta, Peter G. Halverson, Buck Holmes, Eric T. Kvamme, David F. Leary, Patrick Perkins, Mark Scott, Timothy E. Van Eck, Feng Zhao

Author Affiliations +

Proceedings Volume 4852, Interferometry in Space; (2003) https://doi.org/10.1117/12.460946
Event: Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States

Abstract

Visible interferometry at µarc-second accuracy requires measurement of the interferometric baseline length and orientation at picometer accuracy. The optical metrology instruments required for these interferometers must achieve accuracy on order of 1 to 10 picometers. This paper discusses the progress in the development of optical interferometers for use in distance measurement gauges with systematic errors below 100 picometers. The design is discussed as well as test methods and test results.

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Lawrence L. Ames, Robert Barrett, Raymond M. Bell Jr., Lawrence J. Dries, Kalyan Dutta, Peter G. Halverson, Buck Holmes, Eric T. Kvamme, David F. Leary, Patrick Perkins, Mark Scott, Timothy E. Van Eck, and Feng Zhao "SIM external metrology beam launcher (QP) development", Proc. SPIE 4852, Interferometry in Space, (26 February 2003); https://doi.org/10.1117/12.460946

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