26 February 2003 Very high precision absolute surface metrology gauges for building and qualifying SIM testbed intererometer compound optics
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Abstract
The Stellar Interferometry Mission (SIM) and particularly one of its testbeds require compound optical pieces the construction and qualification of which, in turn, require very high-precision absolute surface metrology gauges. In this paper, the details of the design, construction and performance of a triplet of interferometers capable of performing the required measurements are presented.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yekta Gursel, "Very high precision absolute surface metrology gauges for building and qualifying SIM testbed intererometer compound optics", Proc. SPIE 4852, Interferometry in Space, (26 February 2003); doi: 10.1117/12.460882; https://doi.org/10.1117/12.460882
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