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26 February 2003 Wide-field imaging interferometry testbed 3: metrology subsystem
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Abstract
In order for data products from WIIT to be as robust as possible, the alignment and mechanical positions of source, receiver, and detector components must be controlled and measured with extreme precision and accuracy, and the ambient environment must be monitored to allow environmental effects to be correlated with even small perturbations to fringe data. Relevant detailed anatomy of many testbed components and assemblies are described. The system of displacement measuring interferometers (DMI), optical encoders, optical alignment tools, optical power monitors, and temperature sensors implemented for control and monitoring of the testbed is presented.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Douglas B. Leviton, Brad J. Frey, David T. Leisawitz, Anthony J. Martino, William L. Maynard, Lee G. Mundy, Stephen A. Rinehart, Stacy H. Teng, and Xiaolei Zhang "Wide-field imaging interferometry testbed 3: metrology subsystem", Proc. SPIE 4852, Interferometry in Space, (26 February 2003); doi: 10.1117/12.460948; https://doi.org/10.1117/12.460948
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