24 February 2003 Analysis of a chemical method to increase extreme ultraviolet microchannel-plate quantum efficiency
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Abstract
Physical surface changes due to a wet chemical method to increase the extreme ultraviolet (EUV) quantum detection efficiency (QDE) of microchannel plate (MCP) detectors is examined. We show evidence that enhanced channel surface roughness and the creation of a low density surface layer combine to increase the secondary electron emission coefficient, which inturn, increases the quantum detection efficiency of the input MCP. The use of the wet chemical method to enhance the MCP EUV QDE by five different space flight programs is also discussed.
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Richelieu Hemphill, Jerry Edelstein, "Analysis of a chemical method to increase extreme ultraviolet microchannel-plate quantum efficiency", Proc. SPIE 4854, Future EUV/UV and Visible Space Astrophysics Missions and Instrumentation, (24 February 2003); doi: 10.1117/12.459778; https://doi.org/10.1117/12.459778
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