Mechanical characterization of polyvinylchloride pipes using electronic speckle pattern interferometry

Emilia Mihaylova; Vincent Toal; Suzanne Martin; Brian W. Bowe

doi:10.1117/12.463908

27 August 2003 Mechanical characterization of polyvinylchloride pipes using electronic speckle pattern interferometry

Emilia Mihaylova, Vincent Toal, Suzanne Martin, Brian W. Bowe

Proceedings Volume 4876, Opto-Ireland 2002: Optics and Photonics Technologies and Applications; (2003) https://doi.org/10.1117/12.463908
Event: OPTO Ireland, 2002, Galway, Ireland

Abstract

The use of electronic speckle pattern interferometry (ESPI) for non-destructive material characterization of thick and thin unplasticized polyvinylchloride (uPVC) pipes is presented. Pipes are tested by internal pressurization and ESPI gives a complete mapping of the resulting displacement field over the area imaged by the video camera. The results for the strain derived from ESPI data and from the standard mechanical method using strain gauges agree very well with each other. The interferometric method used is non-contact and gives high-confidence results for Young's modulus of uPVC pipes. The fringe counting method gives the total diplsacment over the field of view imaged by the CCD camera and is subject to a fringe error of 0.5. This simple approach is valid when the displacement behavior of the sample is known. When this is not the case then it is necessary to calculate the phase map of the displacement of digitally shifting the phase difference between the two beams in the interferometer. We have implemented this technique by modulating the laser diode drive current to alter the wavelength of the laser very slightly between frames. A linear phase map of the displacement is always obtained in the present case.

Citation Download Citation

Emilia Mihaylova, Vincent Toal, Suzanne Martin, and Brian W. Bowe "Mechanical characterization of polyvinylchloride pipes using electronic speckle pattern interferometry", Proc. SPIE 4876, Opto-Ireland 2002: Optics and Photonics Technologies and Applications, (27 August 2003); https://doi.org/10.1117/12.463908

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
14 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Speckle pattern

Interferometry

Fringe analysis

Interferometers

Semiconductor lasers

CCD cameras

Material characterization

Show All Keywords

Keywords/Phrases

Search In:

Publication Years