Perceptually grounded color evaluation in virtual aided recomposition of fragmented frescos

Floriana Renna; Lea Venturino; Giovanni Attolico; Arcangelo Distante

doi:10.1117/12.464353

19 March 2003 Perceptually grounded color evaluation in virtual aided recomposition of fragmented frescos

Floriana Renna, Lea Venturino, Giovanni Attolico, Arcangelo Distante

Proceedings Volume 4877, Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision; (2003) https://doi.org/10.1117/12.464353
Event: OPTO Ireland, 2002, Galway, Ireland

Abstract

The paper deals with a problem arisen in developing a system for the aided virtual recomposition of fragmented frescos (in particular the S. Mathew's fresco of the S. Francis Upper Church in Assisi). The goal is to expand the capabilities of the operators which remains responsible of the whole process. A core functionality is the automatic evaluation of similarity between images of fragments in a consistent way with evaluations made by humans using their visual perception: a critical property for working in tight cooperation with the operators. This requires a color representation close to human color matching. S-CIELAB, a spatial extension of the CIELAB color representation, is a space whose metrics closely reproduces, through the Euclidean norm, the color distances perceived by a human observer and accounts for the effects of the spatial distribution of colors. S-CIELAB extends CIELAB by incorporating factors related to the pattern-color sensitivity of the human eye. The system ascribes to the fragment pattern-color characteristics according to the visual perception the human operator has of the fragment; the use of automatic tools for color evaluation avoids the inconsistent results due to different operators and to fatigue of the same person over time.

Citation Download Citation

Floriana Renna, Lea Venturino, Giovanni Attolico, and Arcangelo Distante "Perceptually grounded color evaluation in virtual aided recomposition of fragmented frescos", Proc. SPIE 4877, Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision, (19 March 2003); https://doi.org/10.1117/12.464353

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