Translator Disclaimer
8 April 2003 Advanced time-of-flight system-on-a-chip for remote sensing instruments
Author Affiliations +
Abstract
Many remote sensing instruments include the detection of photon/particle events, position decoding and time-of-hit measurement. Microchannel plates (MCPs) are widely used to detect photons and particles for position sensing and relative time of impact in imaging and time-of-flight (TOF) spectrometers. Two dimensional delay lines are used for fast and accurate readout of MCPs. Instruments that use these techniques are Neutral Atom Imagers and Particle Spectrometers to study planetary magnetospheres; photon counting detectors for spectrographic imaging in the far-UV and extreme-UV to study the earth's aurora and airglow; laser range finders. In all these there is a requirement of accurate and/or fast time interval measurement. An advance TOF system-on-a-chip has been developed that includes the complete signal processing electronics for MCP readout: two channels (start- stop) of amplifiers and constant fraction discriminators (CFDs), an 11-bit Time to Digital Converter (TDC), and control/readout logic. The TOF chip is capable for a time resolution of <50ps including time walk and time jitter, the dead time is as low as 0.5us; the power dissipation is a function of counting rate and time resolution-for resolution of ~100ps the power is <20mW at rates <100K/sec and <50mW at rates <1M/sec. The TOF chip flies on the NASA/IMAGE spacecraft launched in 2000 and is part of many other science instruments such as particles and fields, and laser altimeter on MESSENGER.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nicholas P. Paschalidis, Nick Stamatopoulos, Kosta Karadamoglou, George Kottaras, Vasilis Paschalidis, Emmanuel Sarris, Donald G. Mitchell, David C. Humm, Larry J. Paxton, and Ralph L. McNutt Jr. "Advanced time-of-flight system-on-a-chip for remote sensing instruments", Proc. SPIE 4881, Sensors, Systems, and Next-Generation Satellites VI, (8 April 2003); https://doi.org/10.1117/12.463047
PROCEEDINGS
12 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

10 years of degradation trends of the SORCE SIM instrument
Proceedings of SPIE (September 25 2013)
SeaWiFS measurements of the moon
Proceedings of SPIE (December 20 1998)
Design and calibration of the GOES 8 particle sensors ...
Proceedings of SPIE (October 17 1996)
Diffuse EUV spectrometer UCB
Proceedings of SPIE (October 30 1996)

Back to Top