Application of microwave refractometer to flux profile relationships research

Chengguo Liu; Jiying Huang; Changyin Jiang

doi:10.1117/12.467405

30 April 2003 Application of microwave refractometer to flux profile relationships research

Chengguo Liu, Jiying Huang, Changyin Jiang

Proceedings Volume 4894, Microwave Remote Sensing of the Atmosphere and Environment III; (2003) https://doi.org/10.1117/12.467405
Event: Third International Asia-Pacific Environmental Remote Sensing Remote Sensing of the Atmosphere, Ocean, Environment, and Space, 2002, Hangzhou, China

Abstract

Microwave refractometer, a scientific instrument for the determination of atmospheric refractivity which is a function of air pressure, the temperature and the water vapor pressure, has much more exactness and faster response than the sensors of the pressure, the temperature and the humidity. A theory based on the parameter pseudo-refractivity has been developed, which can be used for the more exact determination of flux relationships with microwave refractometer. In this paper the advantages of microwave refractometer over the sensors are analyzed.

Citation Download Citation

Chengguo Liu, Jiying Huang, and Changyin Jiang "Application of microwave refractometer to flux profile relationships research", Proc. SPIE 4894, Microwave Remote Sensing of the Atmosphere and Environment III, (30 April 2003); https://doi.org/10.1117/12.467405

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