Optoelectronic systems for a noncontact dimensional inspection of the cylindrical items in atomic industry

A. N. Baybakov; Yuri V. Chugui; Yu. K. Karlov; K. P. Kascheev; K. I. Koutchinski; Vladimir I. Ladygin; V. G. Marchenko; A. A. Palekhin; Alexander I. Pastushenko; R. D. Pchelkin; Sergey V. Plotnikov; V. V. Rozhkov; M. V. Shindryaev; N. T. Tukubaev; Sergey P. Yunoshev; Yu. A. Zhukov

doi:10.1117/12.484612

29 July 2002 Optoelectronic systems for a noncontact dimensional inspection of the cylindrical items in atomic industry

A. N. Baybakov, Yuri V. Chugui, Yu. K. Karlov, K. P. Kascheev, K. I. Koutchinski, Vladimir I. Ladygin, V. G. Marchenko, A. A. Palekhin, Alexander I. Pastushenko, R. D. Pchelkin, Sergey V. Plotnikov, V. V. Rozhkov, M. V. Shindryaev, N. T. Tukubaev, Sergey P. Yunoshev, Yu. A. Zhukov

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Proceedings Volume 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life; (2002) https://doi.org/10.1117/12.484612
Event: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 2002, Novosibirsk, Russian Federation

Abstract

The optoelectronic systems for noncontact dimensional inspection of cylindrical items applied to atomic industry are presented. The structural schemes of the proposed systems, the technical performances and results of their practical application are given. Inaccuracy of measurements is ± 0.01 — ± 0.03 mm. The inspection capacity is a few hundreds of items per hour. At present these systems are under operating conditions as an integral part of the technological process of the atomic items production.

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A. N. Baybakov, Yuri V. Chugui, Yu. K. Karlov, K. P. Kascheev, K. I. Koutchinski, Vladimir I. Ladygin, V. G. Marchenko, A. A. Palekhin, Alexander I. Pastushenko, R. D. Pchelkin, Sergey V. Plotnikov, V. V. Rozhkov, M. V. Shindryaev, N. T. Tukubaev, Sergey P. Yunoshev, and Yu. A. Zhukov "Optoelectronic systems for a noncontact dimensional inspection of the cylindrical items in atomic industry", Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); https://doi.org/10.1117/12.484612

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