29 July 2002 Panoramic interferometers with flat photoregister
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Proceedings Volume 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life; (2002) https://doi.org/10.1117/12.484536
Event: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 2002, Novosibirsk, Russian Federation
Abstract
To investigate the deformed state of the external surface of cylindrical objects with a diameter of up to 100 mm, three types of panoramic interferometers are proposed. These are holographic interferometers, speckle interferometers and interferometers with a referred wave. Their main element is a conic mirror coaxial with the object. Interferometers have a uniform sensitivity of all displacement vector components on the whole surface. The measuring methods are expounded, the measuring sensitivities and errors are analysed and determined. The application fields of interferometers are considered. The first two interferometers record the initial optical information on a hologram or specklogram and then a set of interferograms is obtained. Interferometers with a referred wave produced interferograms immediately, and their electronic form allows to automatize the measuring process. This interferometer measures the radial and axial displacements. Its sensitivity threshold is comparable with that of holographic interferometers and the largest gradient of the displacements measured is comparable with that of the speckle interferometers.
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Eugene A. Krasnopevtsev, Eugene A. Krasnopevtsev, } "Panoramic interferometers with flat photoregister", Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484536; https://doi.org/10.1117/12.484536
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