29 July 2002 Shack-Hartmann wavefront sensor for beam quality measurements
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Proceedings Volume 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life; (2002); doi: 10.1117/12.484575
Event: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 2002, Novosibirsk, Russian Federation
Abstract
This paper presents an algorithm and results of measurements of beam quality (M2). The algorithm is based on measurements performed by a Shack-Hartmann wavefront sensor (SHWS). The SHWS was designed to investigate the phase distortions of optical fields. Various wavefront parameters, such as Zernike coefficients of phase expansion, Peak-to-Valley, root-mean-square and intensity distribution, are obtained by using the SHWS. Some results of wavefront measurements are presented in this paper. The sensor developed can be widely used not only in scientific investigations and diagnostics, but also in adaptive optical systems to compensate for the phase aberrations.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexis V. Kudryashov, Vladislav Ya. Panchenko, Valentina Ye. Zavalova, "Shack-Hartmann wavefront sensor for beam quality measurements", Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484575; http://dx.doi.org/10.1117/12.484575
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KEYWORDS
Wavefront sensors

Wavefronts

Sensors

Monochromatic aberrations

Beam quality measurement

CCD cameras

Optical testing

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