29 August 2002 Micro/nano-scale integrated photonic devices and circuits: issues and challenges
Author Affiliations +
Proceedings Volume 4905, Materials and Devices for Optical and Wireless Communications; (2002) https://doi.org/10.1117/12.481001
Event: Asia-Pacific Optical and Wireless Communications 2002, 2002, Shanghai, China
Abstract
This paper presents an overview of our study on approaching and achieving micron-scale or nano-scale integrated photonic devices and circuits. We examine the scientific and technological issues and challenges concerning the miniaturization and integration of photonic devices and circuits in micron or submicron scale. We will discuss the size effects, quantum effects, high-field effects, proximity effects, optical interference effect, nonlinear effects, and thermal effects in the process of miniaturization and integration of photonic devices and arrays. Models of our study include the devices and arrays of vertical cavity surface emitting microlasers, microdisk lasers, arrayed waveguides, micro-ring resonator devices and arrays and directional couplers, multi-mode interference devices, and spot-size converters. Issues and challenges for two-dimensional integration and three-dimensional integration are discussed based on realisitic examples. We will also discuss similar effects in micro/nano-scale electronics, so that they can provide the lessons from which the micro/nano-photonics can benefit in a complementary manner.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
El-Hang Lee, El-Hang Lee, Seung-Gol Lee, Seung-Gol Lee, Beomhoan O, Beomhoan O, Se-Geun Park, Se-Geun Park, Sun-Kwan Kim, Sun-Kwan Kim, } "Micro/nano-scale integrated photonic devices and circuits: issues and challenges", Proc. SPIE 4905, Materials and Devices for Optical and Wireless Communications, (29 August 2002); doi: 10.1117/12.481001; https://doi.org/10.1117/12.481001
PROCEEDINGS
13 PAGES


SHARE
RELATED CONTENT


Back to Top