23 August 2002 Analysis and optimization of the arrayed-waveguide grating device with total internal reflection mirrors based on silicon-on-insulator material
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Proceedings Volume 4906, Optical Components and Transmission Systems; (2002) https://doi.org/10.1117/12.480555
Event: Asia-Pacific Optical and Wireless Communications 2002, 2002, Shanghai, China
Abstract
In the AWG device, a total internal reflection(TIR) mirror is fabricated at the middle ofeach arrayed waveguide based on silicon-on-insulator material. We simulate the field distribution of the output lightwave before and after a few TIR mirrors are damaged due to fabrication process and find that there is almost no any change of the output lightwave and the insertion loss ofthe AWG device, which indicates that fabrication ofthis type ofAWG device with TIR mirrors has high tolerance. Simulation results indicate that usage of tapered waveguides can reduce the insertion loss but affect the spectral response of the device. We design a rectangular groove in the middle of each output waveguide near the junction, of the output waveguide and the slab waveguide. Simulation results indicate that this type of structure can broaden the passband and improve the spectral response, while increase the insertion loss of the device a little in the same time.
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Baiyang Li, Xiaoqing Jiang, Minghua Wang, "Analysis and optimization of the arrayed-waveguide grating device with total internal reflection mirrors based on silicon-on-insulator material", Proc. SPIE 4906, Optical Components and Transmission Systems, (23 August 2002); doi: 10.1117/12.480555; https://doi.org/10.1117/12.480555
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