5 September 2002 Application of micro-interferometrics in fiber end surface analysis
Author Affiliations +
A noncontact system for detecting and monitoring the grain and contour of optical connector end face based on Mirau-type interferometer is proposed in this paper. In this system, phase shift technique has been adopted. A five steps algorithm is presented. By this algorithm, the computer can analyze the interference pattern and unwrapped the phase information of the detected surface. Then we can get the differential height of every point on the surface. This method is capable of measuring fiber height to ±0.003 microns and radius of curvature and offset of polish to ±0.30 mm and ±2.0 microns respectively. So we can get not only 2-D and 3-D topography of testing surface, but also the evaluation parameters of surface roughness.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhaohui Li, Zhaohui Li, Wencai Jing, Wencai Jing, Yimo Zhang, Yimo Zhang, Ge Zhou, Ge Zhou, Hongxia Zhang, Hongxia Zhang, Haifeng Li, Haifeng Li, Xiaoming Man, Xiaoming Man, } "Application of micro-interferometrics in fiber end surface analysis", Proc. SPIE 4921, Optical Manufacturing Technologies, (5 September 2002); doi: 10.1117/12.481735; https://doi.org/10.1117/12.481735


What Can Be Interferometered?
Proceedings of SPIE (January 16 1989)
A new instrument for fiber connector endface measurement
Proceedings of SPIE (December 09 2005)
Optical analysis of orange peel on metallic surfaces
Proceedings of SPIE (May 04 2012)
In-process optical metrology for aspheric surfaces
Proceedings of SPIE (September 30 1994)

Back to Top